大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Symposium on Semiconductor Memory Testing (1973 : Cherry Hill) 的图书(共3724本)

More psychometric testing : 1000 new ways to assess your personality, creativity, intelligence and lateral thinking

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索取号:B841.7/E20041
作者:Carter、 Philip J.、
出版社:Chichester, West Sussex, England ; Hoboken, NJ : Wiley, 2003.

Technical digest 1984 : Boston, Massachusetts, October 23-25, 1984

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索取号:TN432-53/E901/1984
作者:IEEE Gallium Arsenide Integrated Circuit Symposium. (1984 : Boston、 Mass.)、IEEE Electron Devices Society.、IEEE Microwave Theory and Techniques Society.、
出版社:Piscataway, N.J. (445 Hoes Lane, Piscataway) : Copies may be obtained from Institute of Electrical and Electronics Engineers, c1984.

The linear control circuits data book for design engineers

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索取号:TN4-62/E804
作者:Texas Instruments Incorporated. Semiconductor Group.、
出版社:Dallas : Texas Instruments, c1976.

Proceedings of the 1976 International Microelectronics Symposium, October 11-13, 1976, Hotel Vancouver, Vancouver, B.C., Canada

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索取号:TN4-53/E804/1976
作者:International Microelectronics Symposium (1976 : Vancouver、 B.C.)、International Society for Hybrid Microelectronics.、
出版社:Montgomery, Ala. : International Society for Hybrid Microelectronics, c1976.

Proceedings of the 1978 International Microelectronics Symposium : September 25-27, 1978, Radisson Hotel Downtown, Minneapolis, MN

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索取号:TN4-53/E804/1978
作者:International Microelectronics Symposium (1978 : Minneapolis、 Minn.)、International Society for Hybrid Microelectronics.、International Society for Hybrid Microelectronics. Technical Program Committee.、
出版社:Montgomery, Ala. (P.O. Box 3255, Montgomery, Ala. 36109) : The Society, c1978.

The Second Symposium on Hybrid Microelectronics

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索取号:TN4/E704/2
作者:Symposium on Hybrid Microelectronics (2nd : 1967 : Boston、 Mass.)、Woulbroun、 John M.、 1932-、Doyle、 George A.、IEEE Parts、 Materials、 and Packaging Group. Boston Chapter.、International Society for Hybrid Microelectronics.、
出版社:[Palo Alto] : International Society for Hybrid Microelectronics; [obtained from Western Periodicals Co., North Hollywood, Calif., 1967].

Semiconductor measurement technology : a bibliography of NBS publications for the years 1962-1986

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索取号:TN307-7/E901
作者:
出版社:[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards ; [Springfield, VA. : Order from National Technical Information Service], 1987.

The transistor and diode data book for design engineers

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索取号:TN305-62/E601
作者:Texas Instruments Incorporated.、Texas Instruments Incorporated. Power semiconductor data book for design engineers.、Texas Instruments Incorporated. Optoelectronics data book for design engineers.、
出版社:Dallas, Tex. : Texas Instrument, Inc., [n.d.].

Semiconductor device technology

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索取号:TN305/E902
作者:Goodge、 Malcolm E.、
出版社:Indianapolis, Ind. : H.W. Sams, 1983.

Gallium arsenide: proceedings of the international symposium organized by the Institute of Physics and the Physical Society in co-operation with the Avionics Laboratory of the U.S. Air Force, Reading, September 1966

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索取号:TN304.23-53/E701/1966
作者:
出版社:London : Institute of Physics & the Physical Society, 1967].

Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J.

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索取号:TN304.07-53/E801/1973
作者:Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、
出版社:New York : IEEE, c1973.

Image science mathematics

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索取号:TN27-53/E801
作者:Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、
出版社:North Hollywood, Calif. : Western Periodicals Co., 1977.

The accuracy of flow measurements by laser doppler methods : proceedings of the LDA-Symposium Copenhagen, 1975

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索取号:TN249-53/E805/1975
作者:LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、
出版社:Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.

The optoelectronics data book for design engineers

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索取号:TN202-62/E801.2
作者:Texas Instruments Incorporated. Semiconductor Group.、
出版社:Dallas, Tex. : Texas Instruments, 1975.

Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971

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索取号:TN14-53/E801/11
作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社:San Francisco, Calif. : San Francisco Press, c1971.

Record of the 10th symposium on electron, ion, and laser beam technology

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索取号:TN14-53/E801/10
作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社:San Francisco : San Francisco Press, [c1969].
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